The Application of Convolution-Based Statistical Model on the Breakdown Time Delay Distributions in Krypton

Summary form only given. The convolution-based model of the electrical breakdown time delay distribution is applied for the statistical analysis of experimental results in krypton-filled diode tube at 2.6 mbar. The electrical breakdown time delay distribution is obtained as the convolution of two random variables (statistical time delay with exponential and discharge formative time with Gaussian distribution). The distribution parameters are obtained by stochastic modeling of time delay distributions, and their comparison with experimental distributions. The breakdown time delay distributions are in good correspondence with the distributions obtained on the basis of 1000 successive and independent measurements. In order to follow transition from Gaussian to the exponential distribution corresponding skewness and kurtosis are plotted