• DocumentCode
    2569643
  • Title

    Non-Uniform Cathode Emission Studies of a Mig Gun

  • Author

    Marchewka, Chad D. ; Sirigiri, Jagadishwar R. ; Shapiro, Michael A. ; Temkin, Richard J. ; Petillo, John J.

  • Author_Institution
    Plasma Sci. & Fusion Center, Massachusetts Inst. of Technol., Cambridge, MA
  • fYear
    2005
  • fDate
    20-23 June 2005
  • Firstpage
    209
  • Lastpage
    209
  • Abstract
    Summary form only given. We present results of emission non-uniformity studies by 3D modeling and experiments on a 96 kV, 40 A magnetron injection gun (MIG) for use in a 1.5 MW 110 GHz gyrotron. Non-uniform beam current density is attributed to emitter surface roughness, surface temperature inhomogeneity, and variation of the work function along the emitting cathode ring. The emission nonuniformity can lead to increased mode competition and an overall decreased efficiency of the device. The gun is modeled from the cathode to the start of the interaction cavity using a 3D gun code, Michelle 3D developed by SAIC. A nonuniform emitter model is incorporated in Michelle to model the measured nonuniform emission from the cathode and to compute its impact on the velocity spread and the beam pitch factor. The designs of capacitive probes to measure the velocity pitch factor at four azimuthal sections of the beam and a rotating probe diagnostic to measure the emission nonuniformity at the cathode are also presented. Experimental results from these diagnostics will be presented and compared with Michelle 3D simulations
  • Keywords
    cathodes; electron emission; electron guns; gyrotrons; magnetrons; work function; 1.5 MW; 110 GHz; 40 A; 96 kV; Michelle 3D code; beam current density; beam pitch factor; capacitive probes; cathode emission; gyrotron; magnetron injection gun; mode competition; rotating probe diagnostic; surface roughness; surface temperature inhomogeneity; velocity spread; work function; Cathodes; Gyrotrons; Nuclear and plasma sciences; Plasma simulation; Probes; Rotation measurement; Rough surfaces; Surface roughness; USA Councils; Velocity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2005. ICOPS '05. IEEE Conference Record - Abstracts. IEEE International Conference on
  • Conference_Location
    Monterey, CA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-9300-7
  • Type

    conf

  • DOI
    10.1109/PLASMA.2005.359246
  • Filename
    4198505