• DocumentCode
    2570568
  • Title

    A 1ps-Resolution Jitter-Measurement Macro Using Interpolated Jitter Oversampling

  • Author

    Nose, Koichi ; Kajita, Mikihiro ; Mizuno, Masayuki

  • Author_Institution
    NEC, Kanagawa
  • fYear
    2006
  • fDate
    6-9 Feb. 2006
  • Firstpage
    2112
  • Lastpage
    2121
  • Abstract
    An in-field real-time successive jitter-measurement macro is developed. It features interpolated jitter oversampling and feedforward calibration that help attain 1ps resolution and a hierarchical Vernier jitter-measurement technique that exploits the trade-off between rms and deterministic jitter measurement characteristics
  • Keywords
    electric noise measurement; jitter; signal sampling; 1 ps; Vernier jitter-measurement; deterministic jitter measurement characteristics; feedforward calibration; interpolated jitter oversampling; jitter-measurement macro; Area measurement; Clocks; Delay lines; Frequency; Jitter; National electric code; Phase measurement; Quantization; Sampling methods; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2006. ISSCC 2006. Digest of Technical Papers. IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    1-4244-0079-1
  • Type

    conf

  • DOI
    10.1109/ISSCC.2006.1696271
  • Filename
    1696271
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2570568