• DocumentCode
    2570643
  • Title

    Microstrip noncontacting thickness monitor

  • Author

    Hurley, R.B. ; Kaufman, I. ; Roy, R.P.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Arizona State Univ., Tempe, AZ, USA
  • fYear
    1989
  • fDate
    13-15 June 1989
  • Firstpage
    905
  • Abstract
    A microwave technique for measuring of the height of a thin layer of fluid or a solid coating on a metallic surface using a planar microstrip transmission line structure is presented. A device was designed to monitor the height of a film of water up to about 1 mm. The method produced consistent results and can be adapted for use without microwave frequency measurement devices.<>
  • Keywords
    microwave measurement; strip lines; thickness measurement; metallic surface; microwave technique; noncontacting thickness monitor; planar microstrip transmission line; thin layer height measurement; Coatings; Frequency measurement; Microstrip; Microwave devices; Microwave frequencies; Microwave measurements; Microwave theory and techniques; Monitoring; Planar transmission lines; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1989., IEEE MTT-S International
  • Conference_Location
    Long Beach, CA, USA
  • Type

    conf

  • DOI
    10.1109/MWSYM.1989.38869
  • Filename
    38869
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2570643