DocumentCode :
2570877
Title :
Using impedance measurement to improve the reliability of traveling-wave distance protection
Author :
Pathirana, Vajira ; Dirks, E. ; McLaren, P.G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Manitoba Univ., Winnipeg, Man., Canada
Volume :
3
fYear :
2003
fDate :
13-17 July 2003
Abstract :
Two common problems associated with distance protection schemes based on traveling waves are close-up faults and faults with small inception angles. This paper examines how the reliability of such a relay may be improved by considering the measured impedance at the relay location. The composite algorithm describes how the traveling wave information and line impedance measurement can be used in parallel in a single protection scheme to develop a high-speed, reliable distance relay. Such a scheme will be extremely useful for long EHV transmission lines where high speed fault clearance is essential. The effects of close-up faults, fault inception angle, and external faults on a three-phase 500 kV power system are examined using an electromagnetic transient program. A laboratory prototype of the relay has been developed using a high speed signal processor.
Keywords :
EMTP; electric impedance measurement; fault location; power transmission faults; power transmission lines; power transmission protection; power transmission reliability; relay protection; 500 kV; EHV transmission lines; close-up faults; distance protection schemes; electromagnetic transient program; external faults; fault clearance; fault inception angles; high speed signal processor; line impedance measurement; power system; relay location; traveling-wave distance protection; Impedance measurement; Power system faults; Power system protection; Power system relaying; Power system reliability; Power system transients; Power transmission lines; Protective relaying; Signal processing algorithms; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Engineering Society General Meeting, 2003, IEEE
Print_ISBN :
0-7803-7989-6
Type :
conf
DOI :
10.1109/PES.2003.1267446
Filename :
1267446
Link To Document :
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