DocumentCode
2571338
Title
Compact model of surface potential in strong inversion channel
Author
Yuehua, Dai ; Junning, Chen ; Daoming, Ke
Author_Institution
Anhui Univ., Hefei
fYear
2007
fDate
22-25 Oct. 2007
Firstpage
1062
Lastpage
1065
Abstract
In this work, the expression of surface potential corresponding to strong inversion state is presented which is distinct from the classical value 2VB due to quantum effect. Then threshold voltage is calculated and it is found that quantum effect affects seriously threshold voltage.
Keywords
MOSFET; Schrodinger equation; quantum optics; surface potential; quantum effect; strong inversion channel; surface potential; threshold voltage; Dielectric constant; Doping; Electrons; Maxwell equations; Potential well; Schrodinger equation; Semiconductor process modeling; Silicon; Space charge; Threshold voltage; Compact model; Quantum effect; Surface potential; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC, 2007. ASICON '07. 7th International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4244-1132-0
Electronic_ISBN
978-1-4244-1132-0
Type
conf
DOI
10.1109/ICASIC.2007.4415816
Filename
4415816
Link To Document