Title :
Spectroscopical study of As2S3 glasses doped with Dy, Sm and Mn
Author :
Iovu, M.S. ; Shutov, S.D. ; Andriesh, A.M. ; Kamitsos, E.I. ; Varsamis, C.P.E. ; Seddon, A.B. ; Furniss, D. ; Popescu, M.
Abstract :
The effect of rare earth (Dy and Sm) and transition metal (Mn) luminescent impurities on the optical properties of As2S3 and As2Se3 glasses is studied in a wide spectral region. Raman, IR, band-to-band and edge absorption spectroscopies are employed to obtain information about the incorporation of impurity ions in the host glass structure and the corresponding changes in intrinsic optical characteristics. In the fundamental absorption region, a reflectivity maximum at 2.98 eV shows blue (Dy, Sm) or red (Mn) shift depending on the electronegativity of the impurity, in accordance with the corresponding variations of the glass structure. Some variations of the characteristic Raman spectra under light exposure and thermal ageing of doped glasses were registered. The observed effects of metal dopants on the As2S3 glass are discussed in connection with the expected behaviour of the impurities in the glass.
Keywords :
Raman spectra; ageing; arsenic compounds; chalcogenide glasses; dysprosium; electronegativity; infrared spectra; manganese; photoluminescence; photoreflectance; red shift; samarium; spectral line shift; 2.98 eV; As2S3:Dy; As2S3:Dy glass optical properties; As2S3:Mn; As2S3:Mn glasses; As2S3:Sm; As2S3:Sm glasses; As2Se3:Dy; As2Se3:Mn; As2Se3:Sm; IR spectra; band-to-band reflectance; blue shift; characteristic Raman spectra; doped glass light exposure/thermal ageing; edge absorption spectra; fundamental absorption region; glass structure variations; host glass structure impurity ion incorporation; impurity electronegativity; intrinsic optical characteristics; rare earth/transition metal luminescent impurities; red shift; reflectivity maximum; Absorption; Doping; Glass; Impurities; Optical films; Particle beam optics; Raman scattering; Reflectivity; Samarium; Spectroscopy;
Conference_Titel :
Semiconductor Conference, 2002. CAS 2002 Proceedings. International
Print_ISBN :
0-7803-7440-1
DOI :
10.1109/SMICND.2002.1105850