Title :
Arrays of resonant tunnelling diodes defined by in-situ focused ion beam lithography: potential millimetre wave/microwave power sources?
Author :
See, P. ; Steenson, D.P. ; Arnone, D.D. ; Linfield, E.H. ; Rose, P.D. ; Collins, C.E. ; Ritchie, D.A. ; Jones, G.A.C.
Author_Institution :
Cavendish Lab., Cambridge Univ., UK
Abstract :
The ability to fabricate and electrically contact an array of small, high current density resonant tunnelling diodes (RTDs) with a common bias connection has potential impact in realising solid state millimetre wave/microwave power sources. In this paper, a novel technique is proposed and demonstrated to form these arrays using a combination of in-situ focused ion beam lithography (FIB) with molecular beam epitaxy (MBE) regrowth. Room temperature DC I-V characteristics of the resulting planar devices are presented, together with preliminary s-parameter measurements and power emission spectra of individual FIB RTDs.
Keywords :
S-parameters; focused ion beam technology; ion beam lithography; microwave diodes; microwave generation; millimetre wave diodes; millimetre wave generation; molecular beam epitaxial growth; resonant tunnelling diodes; DC I-V characteristics; S-parameters; focused ion beam lithography; molecular beam epitaxy; planar device; power emission spectra; resonant tunnelling diode array; solid state microwave power source; solid state millimetre wave power source; Contacts; Current density; Diodes; Ion beams; Lithography; Microwave antenna arrays; Microwave devices; Molecular beam epitaxial growth; Resonant tunneling devices; Solid state circuits;
Conference_Titel :
Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-4774-9
DOI :
10.1109/IEDM.1998.746391