Title :
Thermocouple attachment methods for PCB profiling during Vapour Phase Soldering
Author :
Géczy, Attila ; Kvanduk, Bíborka ; Illés, Balázs ; Illyefalvi-Vitéz, Zsolt
Author_Institution :
Dept. of Electron. Technol., Budapest Univ. of Technol. & Econ., Budapest, Hungary
Abstract :
Vapour Phase Soldering (VPS) is an alternative reflow soldering method, which had a comeback after the introduction of Galden fluid. The heat transfer in a VPS oven is totally different than in the case of conventional soldering methods, such as convectional and IR radiation soldering. Most of the energy (which is required to melt the solder alloy) is transferred to the board during the condensation of the Galden vapour. Printed Circuit Board (PCB) temperature profiling is usually done with thermocouples attached to the board itself with different attachment methods. An unprocessed laminate PCB was prepared for temperature profiling. Standard K-Type thermocouples were attached to it with the standard methods, such as thermocouple fixing with Polyimide tape, SMD adhesive and High-Temperature Solder (HTS) alloy. The paper highlights the importance of condensate film layer, which have an effect on attachments and the thermocouples themselves. The results of the measurements are investigated in the paper.
Keywords :
condensation; heat transfer; printed circuits; reflow soldering; temperature measurement; thermocouples; Galden fluid; Galden vapour condensation; HTS alloy; IR radiation soldering; PCB temperature profiling; SMD adhesive; VPS oven; VPS technology; condensate film layer; heat transfer; high-temperature solder alloy; polyimide tape; printed circuit board temperature profiling; reflow soldering method; standard K-Type thermocouples; thermocouple attachment methods; unprocessed laminate PCB; vapour phase soldering; Films; Fluids; Heating; High temperature superconductors; Soldering; Temperature measurement; Wires; PCB; Profiling; Temperature; Vapour Phase Soldering;
Conference_Titel :
Design and Technology in Electronic Packaging (SIITME), 2012 IEEE 18th International Symposium for
Conference_Location :
Alba Iulia
Print_ISBN :
978-1-4673-4760-0
Electronic_ISBN :
INAVLID ISBN
DOI :
10.1109/SIITME.2012.6384414