DocumentCode
2575001
Title
Automatic Generation Of Synchronous Test Patterns For Asynchronous Circuits
Author
Roig, Oriol ; Cortadella, Jordi ; Peiia, M.A. ; Pastor, Enric
Author_Institution
Department of Computer Architecture, Universitat Politkcnica de Catalunya. Barcelona, Spain.
fYear
1997
fDate
9-13 June 1997
Firstpage
620
Lastpage
625
Keywords
Asynchronous circuits; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Delay; Design for testability; Permission; Synchronous generators; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1997. Proceedings of the 34th
Conference_Location
Anaheim, CA, USA
ISSN
0738-100X
Print_ISBN
0-7803-4093-0
Type
conf
DOI
10.1109/DAC.1997.597220
Filename
597220
Link To Document