DocumentCode
2575300
Title
Si field emitter array with 90-nm-diameter gate holes
Author
Takemura, H. ; Yoshiki, M. ; Furutake, N. ; Tomihari, Y. ; Okamoto, A. ; Miyano, S.
Author_Institution
NEC Corp., Sagamihara, Japan
fYear
1998
fDate
6-9 Dec. 1998
Firstpage
859
Lastpage
862
Abstract
We have successfully developed an extremely scaled-down Si field emitter array with 90-nm-diameter gates. The developed field emitter array has a unique two-step thick insulator underneath the gate electrode, which enables the insulator to be kept thick and which enables the long creeping distance between the emitter and the gate electrodes to be maintained even if the gate diameter is reduced. A fabricated field emitter array has an extremely small gate diameter of 90 nm and shows a low threshold voltage of 22 V at 1 nA/tip.
Keywords
electron field emission; elemental semiconductors; silicon; vacuum microelectronics; 22 V; 90 nm; Si; Si field emitter array; creeping distance; gate hole; threshold voltage; two-step thick insulator; Electrodes; Electron sources; Fabrication; Field emitter arrays; Insulation; Microwave antenna arrays; Microwave devices; National electric code; Resistors; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International
Conference_Location
San Francisco, CA, USA
ISSN
0163-1918
Print_ISBN
0-7803-4774-9
Type
conf
DOI
10.1109/IEDM.1998.746490
Filename
746490
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