• DocumentCode
    2575300
  • Title

    Si field emitter array with 90-nm-diameter gate holes

  • Author

    Takemura, H. ; Yoshiki, M. ; Furutake, N. ; Tomihari, Y. ; Okamoto, A. ; Miyano, S.

  • Author_Institution
    NEC Corp., Sagamihara, Japan
  • fYear
    1998
  • fDate
    6-9 Dec. 1998
  • Firstpage
    859
  • Lastpage
    862
  • Abstract
    We have successfully developed an extremely scaled-down Si field emitter array with 90-nm-diameter gates. The developed field emitter array has a unique two-step thick insulator underneath the gate electrode, which enables the insulator to be kept thick and which enables the long creeping distance between the emitter and the gate electrodes to be maintained even if the gate diameter is reduced. A fabricated field emitter array has an extremely small gate diameter of 90 nm and shows a low threshold voltage of 22 V at 1 nA/tip.
  • Keywords
    electron field emission; elemental semiconductors; silicon; vacuum microelectronics; 22 V; 90 nm; Si; Si field emitter array; creeping distance; gate hole; threshold voltage; two-step thick insulator; Electrodes; Electron sources; Fabrication; Field emitter arrays; Insulation; Microwave antenna arrays; Microwave devices; National electric code; Resistors; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-4774-9
  • Type

    conf

  • DOI
    10.1109/IEDM.1998.746490
  • Filename
    746490