DocumentCode :
2575743
Title :
Iterative distributed model predictive control of nonlinear systems: Handling delayed measurements
Author :
Liu, Jinfeng ; Chen, Xianzhong ; De la Peña, David Muñoz ; Christofides, Panagiotis D.
Author_Institution :
Dept. of Chem. & Biomol. Eng., Univ. of California, Los Angeles, CA, USA
fYear :
2010
fDate :
15-17 Dec. 2010
Firstpage :
7251
Lastpage :
7258
Abstract :
In this work, we focus on iterative distributed model predictive control (DMPC) of large-scale nonlinear systems subject to delayed state feedback. The motivation for studying this control problem is the presence of delayed measurements in feedback control of large-scale chemical processes and the potential use of sensors and actuators in industrial applications to improve closed-loop performance. Under the assumption that there exists an upper bound on the maximum measurement delay, we design an iterative DMPC system for nonlinear systems subject to delayed state feedback. The design takes advantage of bi-directional communication between the distributed controllers used in the iterative DMPC system. Sufficient conditions under which the proposed distributed control design guarantees that the states of the closed-loop system are ultimately bounded in a region that contains the origin are provided. The theoretical results are illustrated through a catalytic alkylation of benzene process.
Keywords :
actuators; closed loop systems; control system synthesis; delays; distributed control; iterative methods; large-scale systems; nonlinear control systems; predictive control; process control; sensors; state feedback; benzene catalytic alkylation process; closed-loop performance; delayed measurements handling; delayed state feedback; iterative DMPC system design; iterative distributed model predictive control; large-scale chemical process control; large-scale nonlinear systems; Delay; Neodymium; Nonlinear systems; Sensors; Trajectory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Decision and Control (CDC), 2010 49th IEEE Conference on
Conference_Location :
Atlanta, GA
ISSN :
0743-1546
Print_ISBN :
978-1-4244-7745-6
Type :
conf
DOI :
10.1109/CDC.2010.5717642
Filename :
5717642
Link To Document :
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