• DocumentCode
    2576144
  • Title

    Test Database Analysis - Inferences from a Disposition Tree

  • Author

    Lee, Jia Keat ; Phon-Amnuaisuk, Somnuk ; Yong, Lee Hong ; Thum, Siew Beng ; Ho, Chin Kuan ; Chew, Huat Chin

  • Author_Institution
    Multimedia Univ., Cyberjaya
  • fYear
    2007
  • fDate
    3-5 Oct. 2007
  • Firstpage
    32
  • Lastpage
    36
  • Abstract
    Test program (TP) is designed to have a few properties including test coverage, test flow and test condition specification. At present, these properties are adjusted based on expert experiences and some statistical tools. Heavy reliance on experts´ opinions and gathered experiences on improving testing efficiency can be reduced if the structure of the test flow is well understood. This paper suggests a way to perform inferences in a very large and complex test database in order to assist test engineers to improve testing efficiency. The TP complexity can be reduced by incorporating (i) expert rules, (ii) test results, and (iii) heuristics to the database. We propose to perform inferences on constructed trees i.e. source tree and disposition tree (DispTree) by counting path frequency and to provide insights for test engineers to identify redundant and misplaced test in a test flow. The proposed approach is evaluated on a considerably huge and complex TP with up to a thousand tests for dual-core microchip.
  • Keywords
    automatic test software; database management systems; trees (mathematics); TP complexity; disposition tree; expert rules; test condition specification; test coverage; test database analysis; test flow; test program; test results; testing efficiency; Circuit faults; Circuit testing; Complexity theory; Costs; Data analysis; Data engineering; Frequency; Multimedia databases; Performance evaluation; Reliability engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 2007. IEMT '07. 32nd IEEE/CPMT International
  • Conference_Location
    San Jose, CA
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4244-1335-5
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2007.4417052
  • Filename
    4417052