• DocumentCode
    257844
  • Title

    Comparison of MgAl2Si2O8:Mn4+ systems doped with co-activator ions in terms of long lifetime for optoelectronic applications

  • Author

    Ozturk, E. ; Kalaycioglu, Nilgun Ozpozan

  • Author_Institution
    Karamanoglu Mehmetbey Univ., Karaman, Turkey
  • fYear
    2014
  • fDate
    26-30 May 2014
  • Firstpage
    159
  • Lastpage
    160
  • Abstract
    Mn4+ doped and Pr3+,4+, Sm3+, Gd3+, Tb3+,4+, Ho3+, Er3+, Tm3+ and Yb3+ co-doped MgAl2Si2O8-based phosphors were prepared by conventional solid state synthesis at 1300 °C. They were characterized by thermogravimetry (TG), differential thermal analysis (DTA), X-ray powder diffraction (XRD), photoluminescence (PL) and scanning electron microscopy (SEM). The luminescence mechanism of the phosphors, which showed broad red emission bands in the range of 600-715 nm and had a different maximum intensity when activated by UV illumination, was discussed. Such a red emission can be attributed to the intrinsic 2E→4A2 transitions of Mn4+.
  • Keywords
    X-ray diffraction; aluminium compounds; differential thermal analysis; erbium; gadolinium; holmium; magnesium compounds; manganese; phosphors; photoluminescence; samarium; scanning electron microscopy; terbium; thulium; ytterbium; DTA; MgAl2Si2O8:Mn; MgAl2Si2O8:Pr,Sm,Gd,Tb,Ho,Er,Tm,Yb; SEM; UV illumination; X-ray powder difraction; XRD; broad red emission band; conventional solid state synthesis; differential thermal analysis; intrinsic 2E4→A2 transition; optoelectronic application; phosphors; photoluminescence; scanning electron microscopy; temperature 1300 degC; thermogravimetry; Crystals; EPON; IEEE 802.3 Standards; Luminescence; Periodic structures; Phosphors; differential thermal analysis (DTA); electron microscopy (SEM); luminescence; powder diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Oxide Materials for Electronic Engineering (OMEE), 2014 IEEE International Conference on
  • Conference_Location
    Lviv
  • Print_ISBN
    978-1-4799-5960-0
  • Type

    conf

  • DOI
    10.1109/OMEE.2014.6912388
  • Filename
    6912388