Title :
Characterization of electron surface scattering in single crystalline metallic nanowires
Author :
Huang, Qiaojian ; Lilley, Carmen M. ; Bode, Matthias
Author_Institution :
Univ. of Illinois at Chicago, Chicago, IL, USA
Abstract :
The research presented in this paper is on the modeling and characterization of electrical resistivity for single crystalline silver nanowires. Silver nanowires were self-assembled on vicinal silicon in a high-vacuum environment with high purity metal sources. These wires are atomically smooth and have little to no contaminants. Current-voltage curves were measured in direct contact using a four-point probe measurement within the high vacuum environment.
Keywords :
electrical resistivity; electron-surface impact; nanowires; silver; Ag; current-voltage curves; electrical resistivity; electron surface scattering; four-point probe measurement; high purity metal sources; high vacuum environment; self-assembly; single crystalline metallic nanowires; Crystallization; Current measurement; Electric resistance; Electrons; Nanowires; Pollution measurement; Scattering; Self-assembly; Silicon; Silver; Electrical resistivity; electron surface scattering; metallic nanowires; single crystalline nanowires;
Conference_Titel :
Nanotechnology Materials and Devices Conference, 2009. NMDC '09. IEEE
Conference_Location :
Traverse City, MI
Print_ISBN :
978-1-4244-4695-7
Electronic_ISBN :
978-1-4244-4696-4
DOI :
10.1109/NMDC.2009.5167569
