• DocumentCode
    2579182
  • Title

    Facelift: Hiding and slowing down aging in multicores

  • Author

    Tiwari, Abhishek ; Torrellas, Josep

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Illinois at Urbana-Champaign, Urbana-Champaign, IL
  • fYear
    2008
  • fDate
    8-12 Nov. 2008
  • Firstpage
    129
  • Lastpage
    140
  • Abstract
    Processors progressively age during their service life due to normal workload activity. Such aging results in gradually slower circuits. Anticipating this fact, designers add timing guardbands to processors, so that processors last for a number of years. As a result, aging has important design and cost implications. To address this problem, this paper shows how to hide the effects of aging and how to slow it down. Our framework is called Facelift. It hides aging through aging-driven application scheduling. It slows down aging by applying voltage changes at key times - it uses a non-linear optimization algorithm to carefully balance the impact of voltage changes on the aging rate and on the critical path delays. Moreover, Facelift can gainfully configure the chip for a short service life. Simulation results indicate that Facelift leads to more cost-effective multicores. We can take a multicore designed for a 7-year service life and, by hiding and slowing down aging, enable it to run, on average, at a 14-15% higher frequency during its whole service life. Alternatively, we can design the multicore for a 5 to 7-month service life and still use it for 7 years.
  • Keywords
    circuit reliability; fault tolerance; logic design; microprocessor chips; multiprocessing systems; nonlinear programming; scheduling; synchronisation; Facelift; aging-driven application scheduling; critical path delay; multicore aging hiding; multicore aging slow down; nonlinear optimization algorithm; processor design; processor service life; timing guardband; voltage change; Aging; Circuits; Computer science; Costs; Delay; Frequency; Multicore processing; Processor scheduling; Threshold voltage; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microarchitecture, 2008. MICRO-41. 2008 41st IEEE/ACM International Symposium on
  • Conference_Location
    Lake Como
  • ISSN
    1072-4451
  • Print_ISBN
    978-1-4244-2836-6
  • Electronic_ISBN
    1072-4451
  • Type

    conf

  • DOI
    10.1109/MICRO.2008.4771785
  • Filename
    4771785