Title :
Modeling of current crowding for on-chip multi turn differential -spiral inductors
Author :
Lin, Changgui ; Kalkur, T.S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Colorado at Colorado Springs, Colorado Springs, CO, USA
Abstract :
Current crowding severely degrades the quality factor (Q) of CMOS on-chip multi-turn spiral inductors. It needs to be considered in the lumped equivalent circuit models of inductors. Therefore its impact on RF circuit´s performance can be captured at circuit simulation phase. Such models have been established for multi-turn single-ended inductors. However they have not been well developed for differential inductors. In this paper, a wideband lumped equivalent circuit model for multi-turn differential inductors is proposed. It contains both resistance and inductance variations due to current crowding. The measurement results agree with the proposed model.
Keywords :
CMOS integrated circuits; inductors; integrated circuit modelling; radiofrequency integrated circuits; CMOS circuit quality factor; RF circuit model; circuit simulation phase; current crowding model; differential inductor; lumped equivalent circuit; on-chip multi turn differential-spiral inductor; wideband lumped circuit; Circuit optimization; Circuit simulation; Degradation; Equivalent circuits; Inductors; Proximity effect; Q factor; Radio frequency; Semiconductor device modeling; Spirals; Spiral Inductors; current crowding; wideband;
Conference_Titel :
EUROCON 2009, EUROCON '09. IEEE
Conference_Location :
St.-Petersburg
Print_ISBN :
978-1-4244-3860-0
Electronic_ISBN :
978-1-4244-3861-7
DOI :
10.1109/EURCON.2009.5167627
