DocumentCode :
2582636
Title :
Using offline and online BIST to improve system dependability - the TTPC-C example
Author :
Steininger, Andreas ; Vilanek, Johann
Author_Institution :
Vienna Univ. of Technol., Austria
fYear :
2002
fDate :
2002
Firstpage :
277
Lastpage :
280
Abstract :
Fault-tolerant distributed real-time systems are facing many new challenges. Although many techniques provide effective masking of node failures on the architectural level, several trends are aggravating the reliability demands on the node level. Starting with a brief presentation of the fault tolerance properties of the time-triggered architecture TTA the corresponding support by the time-triggered protocol controller (TTPC-C) is discussed. We propose a strategy for improving these properties with respect to the anticipated new fault scenarios. It turns out that the application of BIST during node startup and before node reintegration improves system fault tolerance. Additionally a combined strategy of online BIST and error correction can efficiently protect memory. We illustrate the implementation of the proposed mechanisms. Our implementation experiences on an FPGA platform show that the involved overheads are moderate.
Keywords :
built-in self test; distributed processing; error correction; fault tolerant computing; field programmable gate arrays; protocols; real-time systems; FPGA platform; error correction; fault-tolerant distributed real-time systems; memory protection; node failure masking; node reintegration; node startup; offline BIST; online BIST; reliability demands; system dependability; time-triggered architecture; time-triggered protocol controller; Automotive applications; Built-in self-test; Computer architecture; Delay; Electromagnetic interference; Electromagnetic transients; Fault detection; Fault tolerant systems; Packaging; Real time systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 2002. Proceedings. 2002 IEEE International Conference on
ISSN :
1063-6404
Print_ISBN :
0-7695-1700-5
Type :
conf
DOI :
10.1109/ICCD.2002.1106782
Filename :
1106782
Link To Document :
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