Title :
Application of thermoelectricity to IGBT for temperature regulation and energy harvesting
Author :
Tian, Yi ; Vasic, Dejan ; Lefebvre, Stephane
Author_Institution :
SATIE, UniverSud, Cachan, France
Abstract :
The internal junction temperature of an IGBT is the key element of confining life period of components. Meanwhile, during the IGBT works as a switch in a half bridge circuit, it usually arrives at a high temperature level about 150°C to 175°C, due to the accumulation of heat in the junction of IGBT. Thus, a large quantity of energy is lost in the form of heat. This paper focuses on the reduction of the internal junction temperature of the IGBT using a thermoelectric module (TEM), also known as thermoelectric generator (TEG), sitting between the IGBT component and heatsink. As an application of thermoelectric energy harvesting, this technique combines a cooling system equiped TEM for the IGBT and electrical energy harvesting. Moreover, for the optimal load, the maximum electrical harvest power arrives at 0.5 W. Finally, based on the experimental results on two comparable models, we could prove that the cooling system with the TEM reduces internal junction temperature of the IGBT by several degrees. Consequently, with this cooling system, the IGBT could work at a higher current and several electrical energy is harvested.
Keywords :
energy harvesting; heat sinks; insulated gate bipolar transistors; thermoelectric cooling; thermoelectricity; IGBT; TEM; cooling system; half bridge circuit; heatsink; internal junction temperature; power 0.5 W; temperature 150 degC to 175 degC; temperature regulation; thermoelectric energy harvesting; thermoelectric generator; thermoelectric module; thermoelectricity application; Cooling; Force; Heating; Insulated gate bipolar transistors; Junctions; Temperature measurement; Voltage measurement; Thermoelectric module (TEM); cooling system; energy harvesting; reducing temperature; thermoelectricity;
Conference_Titel :
Industrial Electronics (ISIE), 2012 IEEE International Symposium on
Conference_Location :
Hangzhou
Print_ISBN :
978-1-4673-0159-6
Electronic_ISBN :
2163-5137
DOI :
10.1109/ISIE.2012.6237086