DocumentCode
2584337
Title
Risk management in offshore outsourcing of software production using the ICT-supported unified process model: A cross-case study
Author
Yalaho, Anicet ; Nahar, Nazmun
Author_Institution
Dept. of Comput. Sci. & Inf. Syst., Univ. of Jyvaskyla, Jyvaskyla
fYear
2008
fDate
27-31 July 2008
Firstpage
1721
Lastpage
1748
Abstract
Successful execution of ICT-supported unified process of offshore outsourcing (ICT-SUPOO) of software development can offer various important benefits. However, ICT-SUPOO of software development is very complex and risky, and often fails. Almost no empirical studies are available on the risk factors that affect the ICT-SUPOO. The objective of this study is to investigate the key risk factors associated with ICT-SUPOO, understand how they create risks, and how the risks can be alleviated. We carry out a multiple case study from both of the vendorpsilas and clientpsilas sites, where professionals with extensive experience in managing offshore outsourcing of software development were interviewed. Through an in-depth empirical research, we identify a list of risks that affect the success of such projects, analyze how they create risks, and which strategies were implemented by our case companies to alleviate these risks. By using the research results, companies can facilitate successful completion of the ICT-supported offshore outsourcing of software development projects while avoiding the key risks.
Keywords
outsourcing; risk management; software development management; ICT-supported unified process model; offshore outsourcing; risk management; software production; Cities and towns; Companies; Internet; Management information systems; Outsourcing; Production; Programming; Risk analysis; Risk management; Software development management;
fLanguage
English
Publisher
ieee
Conference_Titel
Management of Engineering & Technology, 2008. PICMET 2008. Portland International Conference on
Conference_Location
Cape Town
Print_ISBN
978-1-890843-17-5
Electronic_ISBN
978-1-890843-18-2
Type
conf
DOI
10.1109/PICMET.2008.4599792
Filename
4599792
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