• DocumentCode
    2584592
  • Title

    Characteristics of fault diagnosis for analog circuits based on preset test

  • Author

    Miura, Yukiya

  • Author_Institution
    Graduate Sch. of Eng., Tokyo Metropolitan Univ., Japan
  • fYear
    2005
  • fDate
    3-5 Oct. 2005
  • Firstpage
    573
  • Lastpage
    581
  • Abstract
    We have proposed a method for diagnosing analog circuits, which is realized by combining the operation-region model and the X-Y zoning method. In the method, since we developed a data processing method to handle data discretely, we cloud implement a diagnosis procedure based on the preset test which is a diagnostic method for digital circuits. In this paper, we analyze results of the proposed diagnosis method by changing several parameters for diagnosing a circuit and show their characteristics. Moreover, we propose a new data processing method to obtain a short diagnostic sequence length. We demonstrate the effectiveness of the proposed method by applying it to ITC´97 benchmark circuits with hard faults and soft faults.
  • Keywords
    analogue circuits; circuit testing; data handling; fault diagnosis; X-Y zoning method; analog circuit diagnosis; data processing method; diagnostic sequence length; discrete data handling; fault diagnosis; integrated circuit testing; operation-region model; preset testing; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Data processing; Digital circuits; Electrical fault detection; Fault detection; Fault diagnosis; MOSFETs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2464-8
  • Type

    conf

  • DOI
    10.1109/DFTVS.2005.21
  • Filename
    1544557