• DocumentCode
    2585488
  • Title

    Opportunities at mm-Wave frequencies: SiGe or CMOS?

  • Author

    Veenstra, Hugo ; Notten, Marc

  • Author_Institution
    Philips Res., Eindhoven
  • fYear
    2008
  • fDate
    27-28 Oct. 2008
  • Firstpage
    99
  • Lastpage
    102
  • Abstract
    In contrast to what is generally assumed, the evolution of fT beyond the 45 nm CMOS generation may not be able to follow the ITRS roadmap. Moreover, the gap between intrinsic device and circuit performance is expected to increase with new generations, due to an increase in interconnect parasitic capacitance in the transistor pcell area. Such problems are not expected for SiGe processes. The move to higher frequencies for new applications leads to a shift in system partitioning, since the receiver front-end must be located physically close to the antenna. Emerging mm-Wave applications such as radar and high data-rate wireless need to apply beam-forming which can be realized at low cost using phased arrays. These RF requirements justify a 2-chip solution: one analog phased array front-end plus one digital SoC. RF signal distribution on chip will be a determining factor in the choice of technology. For this reason, SiGe is and will remain leading over CMOS for mm-Wave.
  • Keywords
    CMOS integrated circuits; Ge-Si alloys; capacitance; integrated circuit interconnections; millimetre wave receivers; system-on-chip; transistor circuits; CMOS generation; RF signal distribution on chip; SiGe; analog phased array front-end; beam-forming; digital SoC; high data-rate wireless; interconnect parasitic capacitance; radar; receiver; transistor pcell area; Circuit optimization; Frequency; Germanium silicon alloys; Integrated circuit interconnections; Parasitic capacitance; Phased arrays; Radar antennas; Radar applications; Receiving antennas; Silicon germanium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Integrated Circuit Conference, 2008. EuMIC 2008. European
  • Conference_Location
    Amsterdam
  • Print_ISBN
    978-2-87487-007-1
  • Type

    conf

  • DOI
    10.1109/EMICC.2008.4772238
  • Filename
    4772238