DocumentCode :
2586062
Title :
Foreword
fYear :
2005
fDate :
7-11 March 2005
Abstract :
Presents the welcome message from the conference proceedings.
Keywords :
Automatic testing; Automotive engineering; Circuit testing; Design automation; Electronic equipment testing; Electronics industry; Embedded software; Embedded system; System testing; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2005. Proceedings
Conference_Location :
Munich, Germany
ISSN :
1530-1591
Print_ISBN :
0-7695-2288-2
Type :
conf
DOI :
10.1109/DATE.2005.158
Filename :
1395514
Link To Document :
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