Title :
Noise figure evaluation using low cost BIST
Author :
Negreiros, Marcelo ; Carro, Luigi ; Susin, Altamiro A.
Author_Institution :
Instituto de Informatica, Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
Abstract :
A technique for noise figure evaluation, suitable for BIST implementation, is described. It is based on a low cost single-bit digitizer, which allows the simultaneous evaluation of the noise figure in several test points of the analog circuit. The method is also able to benefit from SoC resources, like memory and processing power. The theoretical background and experimental results are presented in order to demonstrate the feasibility of the approach.
Keywords :
analogue circuits; built-in self test; comparators (circuits); integrated circuit noise; integrated circuit testing; noise generators; quantisation (signal); system-on-chip; SoC analog circuit testing; SoC memory resources; SoC processing power; low cost BIST implementation; noise figure evaluation; noise reference signal; single-bit digitizer; voltage comparator; Analog circuits; Biomedical measurements; Built-in self-test; Circuit noise; Circuit testing; Costs; Electronics industry; Noise figure; Noise measurement; Working environment noise;
Conference_Titel :
Design, Automation and Test in Europe, 2005. Proceedings
Print_ISBN :
0-7695-2288-2
DOI :
10.1109/DATE.2005.224
