Title :
IEEE 1149.4 compatible ABMs for basic RF measurements [analogue boundary modules]
Author :
Syri, Pekka ; Hakkinen, Juha ; Moilanen, Markku
Author_Institution :
Dept. of Electr. & Inf. Eng., Oulu Univ., Finland
Abstract :
An analogue testing standard IEEE 1149.4 is mainly targeted for low-frequency testing. The problem studied in this paper is extending the standard also for radio frequency testing. IEEE 1149.4 compatible measurement structures (ABMs) developed in this study extract the information one is measuring from the radio frequency signal and represent the result as a DC voltage level. The ABMs presented in this paper are targeted for power and frequency measurements operating in frequencies from 1 GHz to 2 GHz. The power measurement error caused by temperature, supply voltage and process variations is roughly 2 dB and the frequency measurement error is 0.1 GHz, respectively.
Keywords :
frequency measurement; integrated circuit testing; measurement errors; power measurement; 1 to 2 GHz; IEEE 1149.4 compatible ABM; RF frequency measurements; RF power measurements; analogue boundary modules; analogue testing standard; measurement errors; process variations; radio frequency testing; supply voltage induced errors; temperature induced errors; Circuit testing; Detectors; Electronic equipment testing; Frequency measurement; Measurement standards; Power measurement; RF signals; Radio frequency; Signal processing; Voltage;
Conference_Titel :
Design, Automation and Test in Europe, 2005. Proceedings
Print_ISBN :
0-7695-2288-2
DOI :
10.1109/DATE.2005.178
