Title :
Sixth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium. SEMI-THERM Proceedings 1990 (Cat. No.90CH2640-1)
Abstract :
The following topics are dealt with: thermal measurement and characterization; thermal management; and thermal simulation, computation, and analysis. Abstracts of individual papers can be found under the relevant classification codes in this or other issues
Keywords :
cooling; packaging; semiconductor technology; temperature measurement; thermal resistance; computation; semiconductor technology; temperature measurement; thermal analysis; thermal characterisation; thermal measurement; thermal simulation;
Conference_Titel :
Semiconductor Thermal and Temperature Measurement Symposium, 1990. SEMI-THERM VI, Proceedings., Sixth Annual IEEE
Conference_Location :
Phoenix, AZ, USA
DOI :
10.1109/STHERM.1990.68505
