• DocumentCode
    2587131
  • Title

    A Wide Tuning Range MEMS Varactor Based on a Toggle Push-Pull Mechanism

  • Author

    Farinelli, Paola ; Solazzi, Francesco ; Calaza, Carlos ; Margesin, Benno ; Sorrentino, Roberto

  • Author_Institution
    RF Microtech, Perugia
  • fYear
    2008
  • fDate
    27-28 Oct. 2008
  • Firstpage
    474
  • Lastpage
    477
  • Abstract
    This paper presents a novel wide tuning range MEMS varactor based on a toggle push - pull mechanism for high RF power applications and improved reliability. The device anchoring utilizes a torsion spring mechanism which virtually allows for a full capacitance tuning range. Improved mechanical stability is also provided by the actively controlled pull-out implementation that is realized without increasing the MEMS manufacturing complexity. As a proof of concept, a toggle MEMS varactor has been modeled, designed and manufactured in shunt configuration on a 50 Omega coplanar transmission line. Analytical and full wave electromechanical models are provided as well as electromagnetic characterization. The device has been manufactured on HR Silicon substrate by using the standard FBK-irst RF MEMS process. Optical profile, DC and RF measurements are presented in the 0-40 GHz frequency band. Excellent RF performance as well as a capacitance tuning ratio of 2.5 has been obtained.
  • Keywords
    coplanar transmission lines; mechanical stability; micromechanical devices; varactors; HR silicon substrate; MEMS; Si; coplanar transmission line; full wave electromechanical models; mechanical stability; resistance 50 ohm; shunt configuration; toggle push-pull mechanism; torsion spring mechanism; varactor; wide tuning range; Capacitance; Coplanar transmission lines; Electromagnetic analysis; Electromagnetic modeling; Micromechanical devices; Radio frequency; Springs; Stability; Varactors; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Integrated Circuit Conference, 2008. EuMIC 2008. European
  • Conference_Location
    Amsterdam
  • Print_ISBN
    978-2-87487-007-1
  • Type

    conf

  • DOI
    10.1109/EMICC.2008.4772332
  • Filename
    4772332