DocumentCode :
2588946
Title :
Phase and amplitude modulation noise metrology
Author :
Nelson, Craig
Author_Institution :
NIST Boulder, USA
fYear :
2009
fDate :
20-24 April 2009
Abstract :
Noise is everywhere. Its ubiquitous nature interferes with or masks desired signals and fundamentally limits all electronic measurements. Noise in the presence of a carrier is experienced as amplitude and phase modulation noise. Modulation noise will be covered from its theory, to its origins and consequences. The effects of signal manipulation such as amplification, frequency translation and multiplication on spectral purity are examined. Practical techniques for measuring AM and PM noise, from the simple to complex will be discussed. Calibration of measurements and common problems and pitfall will also be covered.
Keywords :
Amplitude modulation; Metrology; NIST; Noise generators; Noise level; Optical filters; Optical noise; Optical sensors; Optical variables control; Phase noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 2009 Joint with the 22nd European Frequency and Time forum. IEEE International
Conference_Location :
Besancon, France
ISSN :
1075-6787
Print_ISBN :
978-1-4244-3511-1
Electronic_ISBN :
1075-6787
Type :
conf
DOI :
10.1109/FREQ.2009.5168115
Filename :
5168115
Link To Document :
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