DocumentCode :
2589060
Title :
Auto nanomanipulation system for single cell mechanical property characterization inside an environmental SEM
Author :
Shen, Yajing ; Nakajima, Masahiro ; Homma, Michio ; Fukuda, Toshio
Author_Institution :
Dept. of Micro-Nano Syst. Eng., Nagoya Univ., Nagoya, Japan
fYear :
2012
fDate :
7-12 Oct. 2012
Firstpage :
646
Lastpage :
651
Abstract :
Single cell´s mechanical property characterization is important for the understanding of the cell´s condition and activity. In this paper, an automatic nanomanipulation system was proposed for single cell mechanical property characterization inside an environmental scanning electron microscopy (ESEM). A nanoneedle was fabricated from AFM (atomic force microscopy) cantilever by FIB (focused ion beam) etching technique. The nanoneedle was fixed to a nanorobotic manipulator, which has three degrees of freedom, i.e. X, Y and Z translation. Single yeast cell was put on an tungsten probe substrate inside ESEM. The position information of the nanoneedle and single cell were used as the feedback signals to control the movement of the nanorobotic manipulator. Finally, the stiffness of the single cell was measured using the nanoneedle driven by the automatic nanomanipulation system.
Keywords :
atomic force microscopy; biomechanics; cantilevers; cellular biophysics; elasticity; flexible manipulators; focused ion beam technology; microorganisms; nanobiotechnology; nanofabrication; scanning electron microscopy; sputter etching; AFM cantilever; ESEM; FIB etching technique; atomic force microscopy cantilever; automatic nanomanipulation system; cell condition; environmental SEM; environmental scanning electron microscopy; feedback signals; focused ion beam etching technique; nanoneedle fabrication; nanorobotic manipulator; single cell mechanical property characterization; tungsten probe substrate; Actuators; Etching; Force; Manipulators; Microscopy; Nanobioscience;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Robots and Systems (IROS), 2012 IEEE/RSJ International Conference on
Conference_Location :
Vilamoura
ISSN :
2153-0858
Print_ISBN :
978-1-4673-1737-5
Type :
conf
DOI :
10.1109/IROS.2012.6385731
Filename :
6385731
Link To Document :
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