Title :
The Effects of High Energy Radiation on Failure Mechanisms in Semiconductors Devices
Author :
Honnold, V.R. ; Schoch, C.B.
Author_Institution :
Hughes Aircraft Company, Fullerton, California
Keywords :
Failure analysis; Gamma rays; Insulation; Ionization; Ionizing radiation; Physics; Production; Semiconductor devices; Semiconductor diodes; Semiconductor materials;
Conference_Titel :
Physics of Failure in Electronics, 1962. First Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1962.359987
