• DocumentCode
    2590627
  • Title

    Stochastic power grid analysis considering process variations

  • Author

    Ghanta, Praveen ; Vrudhula, Sarma ; Panda, Rajendran ; Wang, Janet

  • Author_Institution
    Arizona Univ., Tucson, AZ, USA
  • fYear
    2005
  • fDate
    7-11 March 2005
  • Firstpage
    964
  • Abstract
    In this paper, we investigate the impact of interconnect and device process variations on voltage fluctuations in power grids. We consider random variations in the power grid´s electrical parameters as spatial stochastic processes and propose a new and efficient method to compute the stochastic voltage response of the power grid. Our approach provides an explicit analytical representation of the stochastic voltage response using orthogonal polynomials in a Hilbert space. The approach has been implemented in a prototype software called OPERA (Orthogonal Polynomial Expansions for Response Analysis). Use of OPERA on industrial power grids demonstrated speed-ups of up to two orders of magnitude. The results also show a significant variation of about ±35% in the nominal voltage drops at various nodes of the power grids and demonstrate the need for variation-aware power grid analysis.
  • Keywords
    CMOS integrated circuits; Hilbert spaces; circuit analysis computing; integrated circuit interconnections; integrated circuit manufacture; integrated circuit modelling; polynomials; power supply circuits; stochastic processes; CMOS circuits; Hilbert space; OPERA prototype software; Orthogonal Polynomial Expansions for Response Analysis; device process variations; electrical parameters; interconnect process variations; nominal voltage drops; orthogonal polynomials; power grid nodes; process variations; spatial stochastic processes; stochastic power grid analysis; stochastic voltage response; variation-aware power grid analysis; voltage fluctuations; Algorithm design and analysis; CMOS process; Grid computing; Integrated circuit interconnections; Leakage current; Polynomials; Power grids; Stochastic processes; Threshold voltage; Voltage fluctuations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2005. Proceedings
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-2288-2
  • Type

    conf

  • DOI
    10.1109/DATE.2005.282
  • Filename
    1395712