DocumentCode
2590627
Title
Stochastic power grid analysis considering process variations
Author
Ghanta, Praveen ; Vrudhula, Sarma ; Panda, Rajendran ; Wang, Janet
Author_Institution
Arizona Univ., Tucson, AZ, USA
fYear
2005
fDate
7-11 March 2005
Firstpage
964
Abstract
In this paper, we investigate the impact of interconnect and device process variations on voltage fluctuations in power grids. We consider random variations in the power grid´s electrical parameters as spatial stochastic processes and propose a new and efficient method to compute the stochastic voltage response of the power grid. Our approach provides an explicit analytical representation of the stochastic voltage response using orthogonal polynomials in a Hilbert space. The approach has been implemented in a prototype software called OPERA (Orthogonal Polynomial Expansions for Response Analysis). Use of OPERA on industrial power grids demonstrated speed-ups of up to two orders of magnitude. The results also show a significant variation of about ±35% in the nominal voltage drops at various nodes of the power grids and demonstrate the need for variation-aware power grid analysis.
Keywords
CMOS integrated circuits; Hilbert spaces; circuit analysis computing; integrated circuit interconnections; integrated circuit manufacture; integrated circuit modelling; polynomials; power supply circuits; stochastic processes; CMOS circuits; Hilbert space; OPERA prototype software; Orthogonal Polynomial Expansions for Response Analysis; device process variations; electrical parameters; interconnect process variations; nominal voltage drops; orthogonal polynomials; power grid nodes; process variations; spatial stochastic processes; stochastic power grid analysis; stochastic voltage response; variation-aware power grid analysis; voltage fluctuations; Algorithm design and analysis; CMOS process; Grid computing; Integrated circuit interconnections; Leakage current; Polynomials; Power grids; Stochastic processes; Threshold voltage; Voltage fluctuations;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2005. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2288-2
Type
conf
DOI
10.1109/DATE.2005.282
Filename
1395712
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