DocumentCode :
2590874
Title :
The influence of electrode´s stratified structures on SAW devices microwave characteristics
Author :
Suchkov, Sergey ; Suchkov, Dmitry ; Chaikovskiy, Dmitry
Author_Institution :
Phys. Dept., Saratov State Univ., Saratov, Russia
fYear :
2009
fDate :
20-24 April 2009
Firstpage :
443
Lastpage :
445
Abstract :
The thickness and elastic properties of electrodes´ aluminum film as well as behavior nanometer adhesion sublayer influence on characteristics of SAW devices in microwave band. Influence adhesion sublayer thickness to thermostability resonance frequency of IDT on ST-cuts quartz at the 2 GHz and also reflection coefficient SAW from electrodes´ edges IDT is investigated. Determine value layer thickness of aluminum and also values adhesion sublayer thickness of chrome and vanadium into two-layer electrodes at which the reflection coefficient is equal to the zero. In paper is shown substantial influence adhesion sublayer on frequency description amplitude-frequency characteristic of SAW filter. Into the there are some crystallography directions in the crystal LiNbO3 found strong frequency dependence angle between group and phase velocities. Some crystallography crystal cuts and directions in the crystal LiNbO3 with layer structure Ltmetal film-piezocrystalGt on the surface are found at which exists strong frequency dependence of angle between group and phase velocities.
Keywords :
adhesion; crystallography; elasticity; electrodes; lithium compounds; quartz; surface acoustic wave filters; IDT; SAW devices microwave characteristics; SAW filter; ST-cuts quartz; adhesion sublayer thickness; aluminum film; behavior nanometer adhesion sublayer; chrome; crystallography crystal; crystallography directions; elastic property; electrode stratified structures; frequency dependence angle; frequency description amplitude-frequency characteristic; microwave band; phase velocity; reflection coefficient; thermostability resonance frequency; value layer thickness; vanadium; Adhesives; Aluminum; Crystallography; Electrodes; Frequency dependence; Microwave devices; Nanoscale devices; Optical films; Reflection; Surface acoustic wave devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 2009 Joint with the 22nd European Frequency and Time forum. IEEE International
Conference_Location :
Besancon
ISSN :
1075-6787
Print_ISBN :
978-1-4244-3511-1
Electronic_ISBN :
1075-6787
Type :
conf
DOI :
10.1109/FREQ.2009.5168218
Filename :
5168218
Link To Document :
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