Title :
Just-in-time methods for semiconductor manufacturing
Author :
Levitt, Marc E. ; Abraham, Jacob A.
Author_Institution :
Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
Abstract :
A method is presented that allows job shops, such as wafer fabrication lines (fabs), to be analyzed for the application of just-in-time (JIT) production methods. From the resources available and the process recipe, a Kanban policy is derived that allows a pull-type production system to be implemented. Using this method example fabs were analyzed and the JIT/Kanban policies derived were simulated. The simulations show that the proposed method performs very well compared to other fab scheduling policies
Keywords :
integrated circuit manufacture; production control; scheduling; semiconductor device manufacture; stock control; JIT production methods; Kanban policy; fab scheduling policies; just-in-time; pull-type production system; semiconductor manufacturing; wafer fabrication lines; Analytical models; Application software; Computer aided manufacturing; Fabrication; Jacobian matrices; Production systems; Pulp manufacturing; Semiconductor device manufacture; Throughput; Workstations;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1990. ASMC 90 Proceedings. IEEE/SEMI 1990
Conference_Location :
Danvers, MA
DOI :
10.1109/ASMC.1990.111212
