• DocumentCode
    2591241
  • Title

    Verification of embedded memory systems using efficient memory modeling

  • Author

    Ganai, Malay K. ; Gupta, Aarti ; Ashar, Pranav

  • Author_Institution
    NEC Labs. America, Princeton, NJ, USA
  • fYear
    2005
  • fDate
    7-11 March 2005
  • Firstpage
    1096
  • Abstract
    We describe verification techniques for embedded memory systems using efficient memory modeling (EMM), without explicitly modeling each memory bit. We extend our previously proposed approach of EMM in bounded model checking (BMC) for a single read/write port single memory system, to more commonly occurring systems with multiple memories, having multiple read and write ports. More importantly, we augment such EMM to providing correctness proofs, in addition to finding real bugs as before. The novelties of our verification approach are in (a) combining EMM with a proof-based abstraction that preserves the correctness of a property up to a certain analysis depth of SAT-based BMC, and (b) modeling arbitrary initial memory state precisely and thereby providing inductive proofs using SAT-based BMC for embedded memory systems. Similar to the previous approach, we construct a verification model by eliminating memory arrays, but retaining the memory interface signals with their control logic and adding constraints on those signals at every analysis depth to preserve the data forwarding semantics. The size of these EMM constraints depends quadratically on the number of memory accesses and the number of read and write ports; and linearly on the address and data widths and the number of memories. We show the effectiveness of our approach on several industry designs and software programs.
  • Keywords
    embedded systems; formal verification; integrated circuit design; integrated circuit modelling; logic design; semiconductor storage; system-on-chip; SoC; bounded model checking; control logic; correctness proofs; efficient memory modeling; embedded memory system verification; formal verification; inductive proofs; industry designs; multiple memories; multiple read ports; multiple write ports; software programs; Computer bugs; Computer industry; Concrete; Explosions; Laboratories; Logic arrays; National electric code; Read-write memory; Refining; Signal analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2005. Proceedings
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-2288-2
  • Type

    conf

  • DOI
    10.1109/DATE.2005.325
  • Filename
    1395739