• DocumentCode
    259169
  • Title

    Stochastic verification of run-time performance adaptation with field delay testing

  • Author

    Hashimoto, Masanori

  • Author_Institution
    Dept. Inf. Syst. Eng., Osaka Univ., Suita, Japan
  • fYear
    2014
  • fDate
    17-20 Nov. 2014
  • Firstpage
    751
  • Lastpage
    754
  • Abstract
    Run-time performance adaptation with field delay testing is a promising approach for minimizing design margin while sustaining necessary operational margin in the field. However, run-time performance adaptation has not been adopted in industrial designs since a serious concern on timing error occurrence exists. For putting the run-time performance adaptation in a practical use, we need to verify and optimize the run-time adaptation system in design time. For this purpose, we have developed a stochastic framework for error rate estimation that models adaptive speed control as a continuous-time Markov process. In this paper, we evaluate MTTF and power consumption of an embedded processor whose performance is adaptively controlled with online testing and offline testing. This evaluation quantitatively shows the power reduction and MTTF improvement thanks to run-time performance adaptation.
  • Keywords
    Markov processes; integrated circuit design; integrated circuit testing; MTTF; adaptive speed control; continuous-time Markov process; design margin; embedded processor; error rate estimation; field delay testing; run-time performance adaptation; stochastic verification; Delays; Error analysis; Monitoring; Power dissipation; Velocity control; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (APCCAS), 2014 IEEE Asia Pacific Conference on
  • Conference_Location
    Ishigaki
  • Type

    conf

  • DOI
    10.1109/APCCAS.2014.7032890
  • Filename
    7032890