DocumentCode
259169
Title
Stochastic verification of run-time performance adaptation with field delay testing
Author
Hashimoto, Masanori
Author_Institution
Dept. Inf. Syst. Eng., Osaka Univ., Suita, Japan
fYear
2014
fDate
17-20 Nov. 2014
Firstpage
751
Lastpage
754
Abstract
Run-time performance adaptation with field delay testing is a promising approach for minimizing design margin while sustaining necessary operational margin in the field. However, run-time performance adaptation has not been adopted in industrial designs since a serious concern on timing error occurrence exists. For putting the run-time performance adaptation in a practical use, we need to verify and optimize the run-time adaptation system in design time. For this purpose, we have developed a stochastic framework for error rate estimation that models adaptive speed control as a continuous-time Markov process. In this paper, we evaluate MTTF and power consumption of an embedded processor whose performance is adaptively controlled with online testing and offline testing. This evaluation quantitatively shows the power reduction and MTTF improvement thanks to run-time performance adaptation.
Keywords
Markov processes; integrated circuit design; integrated circuit testing; MTTF; adaptive speed control; continuous-time Markov process; design margin; embedded processor; error rate estimation; field delay testing; run-time performance adaptation; stochastic verification; Delays; Error analysis; Monitoring; Power dissipation; Velocity control; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (APCCAS), 2014 IEEE Asia Pacific Conference on
Conference_Location
Ishigaki
Type
conf
DOI
10.1109/APCCAS.2014.7032890
Filename
7032890
Link To Document