DocumentCode
2591897
Title
ISEGEN: generation of high-quality instruction set extensions by iterative improvement
Author
Biswas, Partha ; Banerjee, Sudarshan ; Dutt, Nikil ; Pozzi, Laura ; Ienne, Paolo
Author_Institution
Donald Bren Sch. of Inf. & Comput. Sci., California Univ., Irvine, CA, USA
fYear
2005
fDate
2005
Firstpage
1246
Abstract
Customization of processor architectures through instruction set extensions (ISEs) is an effective way to meet the growing performance demands of embedded applications. A high-quality ISE generation approach needs to obtain results close to those achieved by experienced designers, particularly for complex applications that exhibit regularity; expert designers are able to exploit manually such regularity in the data flow graphs to generate high-quality ISEs. We present ISEGEN, an approach that identifies high-quality ISEs by iterative improvement following the basic principles of the well-known Kernighan-Lin (K-L) min-cut heuristic. Experimental results on a number of MediaBench, EEMBC and cryptographic applications show that our approach matches the quality of the optimal solution obtained by exhaustive search. We also show that our ISEGEN technique is on average 20 times faster than a genetic formulation that generates equivalent solutions. Furthermore, the ISEs identified by our technique exhibit 35% more speedup than the genetic solution on a large cryptographic application (AES) by effectively exploiting its regular structure.
Keywords
computer architecture; data flow graphs; embedded systems; instruction sets; iterative methods; Kernighan-Lin min-cut heuristic; cryptographic application; data flow graphs; embedded applications; exhaustive search; genetic solution; instruction set extension generation; iterative improvement; processor architectures; regular structure; Application software; Computer aided instruction; Computer architecture; Computer science; Cryptography; Embedded computing; Flow graphs; Genetics; High performance computing; Partitioning algorithms;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2005. Proceedings
Conference_Location
Munich, Germany
ISSN
1530-1591
Print_ISBN
0-7695-2288-2
Type
conf
DOI
10.1109/DATE.2005.191
Filename
1395764
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