• DocumentCode
    2591960
  • Title

    PBExplore: a framework for compiler-in-the-loop exploration of partial bypassing in embedded processors

  • Author

    Shrivastava, Aviral ; Dutt, Nikil ; Nicolau, Alex ; Earlie, Eugene

  • Author_Institution
    Sch. of Inf. & Comput. Sci., California Univ., Irvine, CA, USA
  • fYear
    2005
  • fDate
    7-11 March 2005
  • Firstpage
    1264
  • Abstract
    Varying partial bypassing in pipelined processors is an effective way to make performance, area and energy tradeoffs in embedded processors. However, performance evaluation of partial bypassing in processors has been inaccurate, largely due to the absence of bypass-sensitive retargetable compilation techniques. Furthermore no existing partial bypass exploration framework estimates the power and cost overhead of partial bypassing. In this paper we present PBExplore: a framework for compiler-in-the-loop exploration of partial bypassing in processors. PBExplore accurately evaluates the performance of a partially bypassed processor using a generic bypass-sensitive compilation technique. It synthesizes the bypass control logic and estimates the area and energy overhead of each bypass configuration. PBExplore is thus able to effectively perform multidimensional exploration of the partial bypass design space. We present experimental results on the Intel XScale architecture on MiBench benchmarks and demonstrate the need, utility and exploration capabilities of PBExplore.
  • Keywords
    embedded systems; microprocessor chips; performance evaluation; program compilers; Intel XScale architecture; MiBench benchmarks; PBExplore; bypass control logic; compiler-in-the-loop exploration; embedded processors; generic bypass-sensitive compilation; multidimensional exploration; partial bypassing; performance evaluation; Computer science; Costs; Delay; Embedded computing; Hazards; Logic; Microprocessors; Performance evaluation; Registers; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2005. Proceedings
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-2288-2
  • Type

    conf

  • DOI
    10.1109/DATE.2005.236
  • Filename
    1395767