Title :
Using X-parameters to model diode-based RF power probes
Author :
Boaventura, A.S. ; Testera, A.R. ; Carvalho, Nuno Borges ; Barciela, M.F.
Author_Institution :
Universidade de Aveiro, Portugal
Abstract :
Summary form only given, as follows. This paper presents an X-parameter model for diode power probes that can be used for calibration purposes. It will be shown that X-parameters can be applied to diode power probes with significant gains in terms of behavior characterization. This first tentative to apply X-parameters is a step further in the calibration of power probes, when they are excited by modulated signals.
Conference_Titel :
Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-61284-754-2
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2011.5973230
