Title :
The method for evaluating the probability of failures of digital devices under the influence of short electromagnetic pulses
Author :
Parfenov, Yuri V. ; Radask, William A. ; Titov, Boris A. ; Zdoukhov, Leonid N.
Author_Institution :
Joint Inst. for High Temps., Moscow, Russia
Abstract :
The method for evaluating the immunity of digital devices to the influence of repetitive short electromagnetic pulses is proposed. This method makes it possible to choose the optimal characteristics of radiated pulses, and to predict the results of the influence of pulses with arbitrary parameters, etc.
Keywords :
electromagnetic pulse; failure analysis; probability; arbitrary parameters; digital devices failures probability; digital devices immunity evaluation; optimal characteristics; radiated pulses; short electromagnetic pulses; Computational modeling; Computer networks; Computers; Data models; Microstrip; Wires;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1557-0
Electronic_ISBN :
978-1-4577-1558-7
DOI :
10.1109/APEMC.2012.6237859
