• DocumentCode
    259371
  • Title

    Estimating Interval of the Number of Errors for Embedded Software Development Projects

  • Author

    Iwata, Keiji ; Nakashima, Takayoshi ; Anan, Yoshiyuki ; Ishii, Naohiro

  • Author_Institution
    Dept. of Bus. Adm., Aichi Univ., Nagoya, Japan
  • fYear
    2014
  • fDate
    Aug. 31 2014-Sept. 4 2014
  • Firstpage
    604
  • Lastpage
    608
  • Abstract
    Previously, we investigated the prediction of total effort and errors for embedded software development projects using an artificial neural network (ANN). In addition, we proposed a method for reducing this margin of error. However, methods using ANNs have reached their improvement limits, since an appropriate value is estimated using what is known as point estimation in statistics. In this paper, we propose a method for predicting the number of errors for embedded software development projects using interval estimation provided by a support vector machine (SVM) and ANN. In our evaluation experiment, we compared the accuracy of the SVM model with that of the ANN model using 10-fold cross-validation. Results of Welch´s t-test show that the SVM model is more accurate.
  • Keywords
    embedded systems; neural nets; project management; software engineering; statistical testing; support vector machines; 10-fold cross-validation; ANN model; SVM model; Welch´s t-test; artificial neural network; embedded software development projects; error number interval estimation; support vector machine; Accuracy; Artificial neural networks; Data models; Embedded software; Predictive models; Support vector machines; artificial neural network; embedded software development; support vector machine;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Applied Informatics (IIAIAAI), 2014 IIAI 3rd International Conference on
  • Conference_Location
    Kitakyushu
  • Print_ISBN
    978-1-4799-4174-2
  • Type

    conf

  • DOI
    10.1109/IIAI-AAI.2014.129
  • Filename
    6913373