DocumentCode
259381
Title
Feature Description Using Center-Symmetric Extended Local Ternary Patterns
Author
Wen-Hung Liao ; Chia-Yu Liu ; Ming-Ching Lin
Author_Institution
Dept. of Comput. Sci., Nat. Chengichi Univ., Taipei, Taiwan
fYear
2014
fDate
10-12 Dec. 2014
Firstpage
94
Lastpage
97
Abstract
Effective recognition of objects calls for the appropriate selection of feature descriptor. In this paper, we generalize the "extended local ternary patterns" (ELTP) to form a novel and compact set of features named center-symmetric extended local ternary patterns (CS-ELTP). The newly defined CS-ELTP follows a simplified encoding procedure and has a lower dimension for a fixed neighborhood region. It achieves good balances among feature dimension, recognition rate and noise resistance according to our comparative experimental analysis. In addition, we combine binary and ternary patterns to create a class of hybrid descriptor that possesses the characteristics of both types of descriptor. Experimental results indicate that the hybrid descriptor can improve the performance in noisy conditions while maintaining a reasonable feature dimension.
Keywords
feature extraction; feature selection; image classification; object recognition; CS-ELTP; binary patterns; center-symmetric extended local ternary patterns; encoding procedure; feature description; feature descriptor selection; feature dimension; noise resistance; object recognition; recognition rate; Computer vision; Encoding; Noise; Pattern recognition; Resistance; Robustness; Vectors; center-symmetric extended local ternary patterns; hybrid descriptor; texture classification;
fLanguage
English
Publisher
ieee
Conference_Titel
Multimedia (ISM), 2014 IEEE International Symposium on
Conference_Location
Taichung
Print_ISBN
978-1-4799-4312-8
Type
conf
DOI
10.1109/ISM.2014.35
Filename
7033001
Link To Document