• DocumentCode
    259381
  • Title

    Feature Description Using Center-Symmetric Extended Local Ternary Patterns

  • Author

    Wen-Hung Liao ; Chia-Yu Liu ; Ming-Ching Lin

  • Author_Institution
    Dept. of Comput. Sci., Nat. Chengichi Univ., Taipei, Taiwan
  • fYear
    2014
  • fDate
    10-12 Dec. 2014
  • Firstpage
    94
  • Lastpage
    97
  • Abstract
    Effective recognition of objects calls for the appropriate selection of feature descriptor. In this paper, we generalize the "extended local ternary patterns" (ELTP) to form a novel and compact set of features named center-symmetric extended local ternary patterns (CS-ELTP). The newly defined CS-ELTP follows a simplified encoding procedure and has a lower dimension for a fixed neighborhood region. It achieves good balances among feature dimension, recognition rate and noise resistance according to our comparative experimental analysis. In addition, we combine binary and ternary patterns to create a class of hybrid descriptor that possesses the characteristics of both types of descriptor. Experimental results indicate that the hybrid descriptor can improve the performance in noisy conditions while maintaining a reasonable feature dimension.
  • Keywords
    feature extraction; feature selection; image classification; object recognition; CS-ELTP; binary patterns; center-symmetric extended local ternary patterns; encoding procedure; feature description; feature descriptor selection; feature dimension; noise resistance; object recognition; recognition rate; Computer vision; Encoding; Noise; Pattern recognition; Resistance; Robustness; Vectors; center-symmetric extended local ternary patterns; hybrid descriptor; texture classification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia (ISM), 2014 IEEE International Symposium on
  • Conference_Location
    Taichung
  • Print_ISBN
    978-1-4799-4312-8
  • Type

    conf

  • DOI
    10.1109/ISM.2014.35
  • Filename
    7033001