Title :
MRF model-based segmentation of range images
Author :
Jain, Anil K. ; Nadabar, Sateesha G.
Author_Institution :
Dept. of Comput. Sci., Michigan State Univ., East Lansing, MI, USA
Abstract :
Consideration is given to the application of Markov random field (MRF) models to the problem of edge labeling in range images. The authors propose a segmentation algorithm which handles both jump and crease edges. The jump and crease edge likelihoods at each edge site are computed using special local operators. These likelihoods are then combined in a Bayesian framework with a MRF prior distribution on the edge labels to derive the a posterior distribution of labels. An approximation to the maximum a posteriori estimate is used to obtain the edge labelings. The edge-based segmentation has been integrated with a region-based segmentation scheme resulting in a robust surface segmentation method
Keywords :
Markov processes; computer vision; computerised pattern recognition; Bayesian framework; MRF model-based segmentation; Markov random field; crease edges; edge labeling; edge labels; edge-based segmentation; jump edges; range images; robust surface segmentation; segmentation algorithm; Bayesian methods; Context modeling; Data mining; Image edge detection; Image segmentation; Labeling; Markov random fields; Sensor arrays; Shape; Surface texture;
Conference_Titel :
Computer Vision, 1990. Proceedings, Third International Conference on
Conference_Location :
Osaka
Print_ISBN :
0-8186-2057-9
DOI :
10.1109/ICCV.1990.139615