DocumentCode :
2594189
Title :
UWB NGD circuit for time-delay reduction
Author :
Ravelo, B. ; Jastrzebski, A.K.
Author_Institution :
Grad. Sch. of Eng. ESIGELEC, IRSEEM, St. Etienne du Rouvray, France
fYear :
2012
fDate :
21-24 May 2012
Firstpage :
789
Lastpage :
792
Abstract :
Theoretical and experimental analyses of circuit enabling the delay reduction is established. The basic expressions illustrating the functioning principle of the circuit generating the negative group delay (NGD) phenomenon is explored. To validate the analytical concept, a two-stage device was implemented. After measurements, UWB group delay with optimal negative value of about -5 ns was generated. Then, time-domain investigation is performed to demonstrate the functioning of the negative time-delay by considering a pulse signal with half-height half-width of about tens ns. Example of applications of the NGD circuit proposed for the signal reconstitution with rise-time and propagation delay cancellation is presented by considering periodical digital signal with 1-Gbit/s rate degraded by RLC-perturbation. The NGD circuit is important for the correction of the EMI/EMC effects or reduction of signal delays.
Keywords :
delays; electromagnetic compatibility; radiofrequency interference; signal processing; time-domain analysis; ultra wideband communication; EMI-EMC effects; NGD phenomenon; RLC-perturbation; UWB NGD circuit; UWB group delay; functioning principle; half-height half-width signal; negative group delay phenomenon; negative time-delay; optimal negative value; periodical digital signal reconstitution; propagation delay cancellation; pulse signal; rise-time; signal delays reduction; time-delay reduction; time-domain investigation; two-stage device; Delay; Frequency measurement; Integrated circuit interconnections; Integrated circuit modeling; Propagation delay; RLC circuits; Transfer functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1557-0
Electronic_ISBN :
978-1-4577-1558-7
Type :
conf
DOI :
10.1109/APEMC.2012.6237892
Filename :
6237892
Link To Document :
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