Bulk current injection test modeling using an equivalent circuit for 1.8V mobile ICs

Author

Kwak, Sang Keun ; Jo, Jeong Min ; Noh, Seok Soon ; Lee, Hye Sook ; Nah, Wansoo ; Kim, So Young

Author_Institution

Dept. of Semicond. Syst. Eng., Sungkyunkwan Univ., Suwon, South Korea

fYear

2012

fDate

21-24 May 2012

Firstpage

565

Lastpage

568

Abstract

This paper shows a novel simulation method for bulk current injection (BCI) tests of I/O buffer circuits of mobile system memory. The simulation model consists of BCI probe, directional coupler, PCB, PKG, and IC. The proposed method is based on a behavioural I/O buffer model using a pulse generator as an input. A detailed simulation flow is introduced and validated through simulations performed on several injection probe loading conditions using a power decoupling capacitor and an on-chip decoupling capacitor.

Keywords

buffer circuits; directional couplers; integrated memory circuits; mobile handsets; printed circuits; pulse generators; radiofrequency integrated circuits; BCI test; I-O buffer model; PCB; PKG; bulk current injection test modeling; directional coupler; input-output buffer circuit; mobile IC; mobile system memory; on-chip decoupling capacitor; power decoupling capacitor; pulse generator; voltage 1.8 V; Capacitors; Energy management; Generators; Immunity testing; Integrated circuit modeling; Radio frequency;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on

Conference_Location

Singapore

Print_ISBN

978-1-4577-1557-0

Electronic_ISBN

978-1-4577-1558-7

Type

conf

DOI

10.1109/APEMC.2012.6237908

Filename

6237908