DocumentCode :
2594497
Title :
Statistical Consideration of Dielectric Breakdown of Polymeric Insulating Material
Author :
Noguchi, Kazuo ; Okamoto, Yoshiwo ; Sekii, Yasuo
Author_Institution :
Chiba Inst. of Technol., Narashino
fYear :
2008
fDate :
26-29 Oct. 2008
Firstpage :
563
Lastpage :
566
Abstract :
To study the statistical behavior of dielectric breakdown of polymeric materials, experiments were conducted using a parallel plate electrode system for two polymeric insulating materials: low-density polyethylene (LDPE) and polyethylene terephthalate (PET). The results of the experiment were analyzed applying the Weibull distribution function. Values of median breakdown strength (BDS), shape and location parameters of Weibull distribution function were evaluated to elucidate the dielectric breakdown of both materials. The results underscore the great difference in breakdown strengths of LDPE and PET. The number and size of impurities included in both materials was examined to judge their influence on the breakdown strength. Based on statistical analyses of experimental results, the impurities´ influence on dielectric breakdown of polymeric materials was discussed.
Keywords :
Weibull distribution; electric breakdown; polyethylene insulation; polymer insulators; statistical analysis; Weibull distribution function; dielectric breakdown; low-density polyethylene; median breakdown strength; parallel plate electrode system; polyethylene terephthalate; polymeric insulating material; polymeric materials; statistical consideration; Conducting materials; Dielectric breakdown; Dielectric materials; Dielectrics and electrical insulation; Electric breakdown; Plastic insulation; Polyethylene; Polymers; Positron emission tomography; Weibull distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2008. CEIDP 2008. Annual Report Conference on
Conference_Location :
Quebec, QC
Print_ISBN :
978-1-4244-2548-8
Electronic_ISBN :
978-1-4244-2549-5
Type :
conf
DOI :
10.1109/CEIDP.2008.4772799
Filename :
4772799
Link To Document :
بازگشت