• DocumentCode
    2594497
  • Title

    Statistical Consideration of Dielectric Breakdown of Polymeric Insulating Material

  • Author

    Noguchi, Kazuo ; Okamoto, Yoshiwo ; Sekii, Yasuo

  • Author_Institution
    Chiba Inst. of Technol., Narashino
  • fYear
    2008
  • fDate
    26-29 Oct. 2008
  • Firstpage
    563
  • Lastpage
    566
  • Abstract
    To study the statistical behavior of dielectric breakdown of polymeric materials, experiments were conducted using a parallel plate electrode system for two polymeric insulating materials: low-density polyethylene (LDPE) and polyethylene terephthalate (PET). The results of the experiment were analyzed applying the Weibull distribution function. Values of median breakdown strength (BDS), shape and location parameters of Weibull distribution function were evaluated to elucidate the dielectric breakdown of both materials. The results underscore the great difference in breakdown strengths of LDPE and PET. The number and size of impurities included in both materials was examined to judge their influence on the breakdown strength. Based on statistical analyses of experimental results, the impurities´ influence on dielectric breakdown of polymeric materials was discussed.
  • Keywords
    Weibull distribution; electric breakdown; polyethylene insulation; polymer insulators; statistical analysis; Weibull distribution function; dielectric breakdown; low-density polyethylene; median breakdown strength; parallel plate electrode system; polyethylene terephthalate; polymeric insulating material; polymeric materials; statistical consideration; Conducting materials; Dielectric breakdown; Dielectric materials; Dielectrics and electrical insulation; Electric breakdown; Plastic insulation; Polyethylene; Polymers; Positron emission tomography; Weibull distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2008. CEIDP 2008. Annual Report Conference on
  • Conference_Location
    Quebec, QC
  • Print_ISBN
    978-1-4244-2548-8
  • Electronic_ISBN
    978-1-4244-2549-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2008.4772799
  • Filename
    4772799