• DocumentCode
    2595191
  • Title

    Investigation on the effect of parasitic inductance at connector contact boundary on electromagnetic radiation

  • Author

    Hayashi, Yu-ichi ; Matsuda, Kazuki ; Mizuki, Takaaki ; Sone, Hideaki

  • Author_Institution
    Dept. of Electr. & Commun. Eng., Tohoku Univ., Sendai, Japan
  • fYear
    2012
  • fDate
    21-24 May 2012
  • Firstpage
    65
  • Lastpage
    68
  • Abstract
    A loosened connector causes an increase in electromagnetic radiation when electric devices operate in high-frequency bands. To investigate the mechanisms generating electromagnetic radiation due to a loose contact in a connector, we estimate high-frequency circuit elements at the contact boundary of a loosened connector. On the basis of this estimation, we show the relationship between high-frequency circuit elements and the electromagnetic radiation from electric devices through experiments.
  • Keywords
    electromagnetic devices; interference suppression; connector contact boundary; electric devices; electromagnetic radiation; electromagnetic radiation suppression; high-frequency bands; high-frequency circuit element estimation; parasitic inductance effect; Abstracts; Current measurement; Educational institutions; Estimation; Inductance; Inductance measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4577-1557-0
  • Electronic_ISBN
    978-1-4577-1558-7
  • Type

    conf

  • DOI
    10.1109/APEMC.2012.6237952
  • Filename
    6237952