DocumentCode
2595367
Title
On-chip intra decoupling measurements for integrated magnetic thin film
Author
Kodate, Wataru ; Endo, Yasushi ; Yamaguchi, Masahiro
Author_Institution
Dept. of Electr. & Commun. Eng., Tohoku Univ., Sendai, Japan
fYear
2012
fDate
21-24 May 2012
Firstpage
341
Lastpage
344
Abstract
Performance of magnetic thin-film is evaluated as a candidate for on-chip noise suppressor. Miniature loops coils implemented on a 90 nm design test element group (TEG) chip are used as the noise transmitter and receiver. Differential transmission parameter Sdd21 is evaluated as a measure of inductive noise intra-decoupling. Magnetic film is useful for frequency selective noise decoupler. The coupling is supported most at the ferromagnetic resonance (FMR) frequency, which is deviated from its intrinsic frequency and the degree of deviation can be calculated by using characteristic length. These results demonstrate that the proposed method is useful to characterize the IC chip level noise suppressor in the GHz range.
Keywords
Long Term Evolution; ferromagnetic resonance; magnetic thin films; radio receivers; radio transmitters; FMR frequency; IC chip level noise suppressor; Long Term Evolution; differential transmission parameter Sdd21; ferromagnetic resonance frequency; integrated magnetic thin film; magnetic thin-film performance; miniature loops coils; noise receiver; noise transmitter; on-chip intra decoupling measurements; on-chip noise suppressor; test element group chip; Coils; Magnetic films; Magnetic flux; Magnetic resonance; Noise; Semiconductor device measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location
Singapore
Print_ISBN
978-1-4577-1557-0
Electronic_ISBN
978-1-4577-1558-7
Type
conf
DOI
10.1109/APEMC.2012.6237961
Filename
6237961
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