• DocumentCode
    2595367
  • Title

    On-chip intra decoupling measurements for integrated magnetic thin film

  • Author

    Kodate, Wataru ; Endo, Yasushi ; Yamaguchi, Masahiro

  • Author_Institution
    Dept. of Electr. & Commun. Eng., Tohoku Univ., Sendai, Japan
  • fYear
    2012
  • fDate
    21-24 May 2012
  • Firstpage
    341
  • Lastpage
    344
  • Abstract
    Performance of magnetic thin-film is evaluated as a candidate for on-chip noise suppressor. Miniature loops coils implemented on a 90 nm design test element group (TEG) chip are used as the noise transmitter and receiver. Differential transmission parameter Sdd21 is evaluated as a measure of inductive noise intra-decoupling. Magnetic film is useful for frequency selective noise decoupler. The coupling is supported most at the ferromagnetic resonance (FMR) frequency, which is deviated from its intrinsic frequency and the degree of deviation can be calculated by using characteristic length. These results demonstrate that the proposed method is useful to characterize the IC chip level noise suppressor in the GHz range.
  • Keywords
    Long Term Evolution; ferromagnetic resonance; magnetic thin films; radio receivers; radio transmitters; FMR frequency; IC chip level noise suppressor; Long Term Evolution; differential transmission parameter Sdd21; ferromagnetic resonance frequency; integrated magnetic thin film; magnetic thin-film performance; miniature loops coils; noise receiver; noise transmitter; on-chip intra decoupling measurements; on-chip noise suppressor; test element group chip; Coils; Magnetic films; Magnetic flux; Magnetic resonance; Noise; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4577-1557-0
  • Electronic_ISBN
    978-1-4577-1558-7
  • Type

    conf

  • DOI
    10.1109/APEMC.2012.6237961
  • Filename
    6237961