• DocumentCode
    2595545
  • Title

    An effect of TiO2 morphology on performance of ITO/TiO2/MEH-PPV/Au solar cells

  • Author

    Inpor, Kroekchai ; Reabanko, Somjai ; Boonchan, Pratya ; Mahingsupan, Nuntiya ; Sahasithiwat, Somboon ; Limthongkul, Pimpa ; Sae-Kung, Chaiyuth ; Sichanugrist, Porponth ; Thanachayanont, Chanchana

  • Author_Institution
    Inst. of Solar Energy Technol. Dev., Pathum Thani
  • Volume
    2
  • fYear
    2008
  • fDate
    14-17 May 2008
  • Firstpage
    829
  • Lastpage
    832
  • Abstract
    ITO/TiO2/MEH-PPV/Au solar cells were fabricated using nano-porous titanium dioxide (TiO2) infiltrated with poly(2-methoxy-5-(2´-ethylhexyloxy)-p-phenylene vinylene) (MEH-PPV). The TiO2 films were prepared using poly(ethylene glycol) (PEG) having different molecular weights and spin coated onto indium tin oxide (ITO) coated glass substrates. Transmission electron microscopy (TEM) showed that the dip-coated TiO2 films had uniform thickness of around 70 nm. Surface morphologies of the TiO2 films were investigated using scanning electron microscopy (SEM). It was found that the low molecular weight PEG resulted in small pits in the TiO2 film and increase contact area between TiO2 and MEH-PPV improving the device efficiency of this solar cell.
  • Keywords
    gold; molecular weight; nanoporous materials; organic semiconductors; polymer films; scanning electron microscopy; solar cells; spin coating; surface morphology; titanium compounds; transmission electron microscopy; ITO-TiO2; contact area; device efficiency; film thickness; indium tin oxide coated glass substrates; molecular weights; nanoporous titanium dioxide film; poly(2-methoxy-5-(2´-ethylhexyloxy)-p-phenylene vinylene); poly(ethylene glycol); scanning electron microscopy; solar cells; spin coating; surface morphology; transmission electron microscopy; Gold; Indium tin oxide; Materials science and technology; Morphology; Photovoltaic cells; Polymer films; Scanning electron microscopy; Semiconductor films; Titanium; Transmission electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, 2008. ECTI-CON 2008. 5th International Conference on
  • Conference_Location
    Krabi
  • Print_ISBN
    978-1-4244-2101-5
  • Electronic_ISBN
    978-1-4244-2102-2
  • Type

    conf

  • DOI
    10.1109/ECTICON.2008.4600558
  • Filename
    4600558