Title :
Novel method To identify electrical mechanisms responsible for functional failures during Direct Power Injection “DPI”
Author :
Abouda, Kamel ; Besse, Patrice ; Laplagne, Thierry
Author_Institution :
Freescale Semicond., Toulouse, France
Abstract :
In particular applications, integrated circuits (ICs) have to be designed to guarantee safe operations during severe electromagnetic aggressions stresses such as Direct Power Injection (DPI). Unfortunately, the simulation of functional failures during DPI events remains very challenging for analogue products due the large frequency domain and to the lack of models for internal parasitic coupling. This paper describes a test method to identify the design functions and the physical mechanisms that lead to functional failures when integrated circuits are submitted to EMC stress.
Keywords :
electromagnetic compatibility; failure analysis; integrated circuit design; integrated circuit testing; DPI event; EMC stress; IC; analogue products; design function; direct power injection; electrical mechanisms; electromagnetic aggressions stress; frequency domain; functional failures; integrated circuits; internal parasitic coupling; physical mechanism; Electrostatic discharges; Integrated circuits; Junctions; Pulse width modulation; Stress; Stress measurement;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1557-0
Electronic_ISBN :
978-1-4577-1558-7
DOI :
10.1109/APEMC.2012.6238003