Title :
Loop-back linearity test of ADCs and DACs
Author :
Di Nisio, Attilio ; Giaquinto, N. ; Savino, M.
Author_Institution :
Dept. of Electr. & Electron. Eng. (DEE), Polytech. of Bari, Bari, Italy
Abstract :
A loop-back test is illustrated, where the outputs of a DAC are dithered by additive noise and digitized by an ADC. The samples are collected in a code occurrences table, which allows the measurement of the input/outputs characteristics of both the ADC and the DAC. The method is particularly suited for implementing self-calibration strategies. The measurement is performed by means of maximum likelihood estimation and is therefore statistically nearly optimal. After a description of the method, experimental data are illustrated for validating the proposed linearity test.
Keywords :
analogue-digital conversion; calibration; digital-analogue conversion; integrated circuit testing; maximum likelihood estimation; ADCs loop-back linearity test; DAC characteristics measurement; additive noise; code occurrences table; maximum likelihood estimation; self-calibration strategies; Additive noise; Built-in self-test; Electric variables measurement; Electronic equipment testing; Instruments; Linearity; Maximum likelihood estimation; Noise measurement; Performance evaluation; System testing; Analog-digital conversion; Digital-analog conversion; electric variables measurement; maximum likelihood estimation; nonlinearities; parameter estimation; testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-3352-0
DOI :
10.1109/IMTC.2009.5168569
